|
Configuration Notes
For the F CPUs listed below you can stretch out the proof test interval (or mission time) to 20 years. Here, you must set the probability of a dangerous failure per hour (PFH) to the same value and the average probability of failure on demand (PFD) to double the value of a proof test interval of 10 years.
| F-CPU |
MLFB |
PFD |
PFH |
Proof test interval |
| IM 151-7 F-CPU |
6ES7151-7FA01-0AB0 |
1,59E-05 |
3,62E-10 |
10 years |
| 3,18E-05 |
3,62E-10 |
20 years |
| 6ES7151-7FA20-0AB0 |
1,59E-05 |
3,62E-10 |
10 years |
| 3,18E-05 |
3,62E-10 |
20 years |
| 6ES7151-7FA21-0AB0 |
<1,5E-05 |
<0,35E-09 |
10 years |
| <3E-05 |
<0,35E-09 |
20 years |
| IM 151-8F PN/DP CPU |
6ES7151-8FB00-0AB0 |
<5E-05 |
<2E-09 |
10 years |
| <1E-04 |
<2E-09 |
20 years |
| 6ES7151-8FB01-0AB0 |
<4E-05 |
<1E-09 |
10 years |
| <8E-05 |
<1E-09 |
20 years |
| IM154-8F PN/DP CPU |
6ES7154-8FB01-0AB0 |
<4E-05 |
<1E-09 |
10 years |
| <8E-05 |
<1E-09 |
20 years |
| 6ES7154-8FX00-0AB0 |
<4E-05 |
<1E-09 |
10 years |
| <8E-05 |
<1E-09 |
20 years |
| CPU 315F-2 DP |
6ES7315-6FF01-0AB0 |
2,38E-05 |
5,43E-10 |
10 years |
| 4,76E-05 |
5,43E-10 |
20 years |
| 6ES7315-6FF04-0AB0 |
<2E-05 |
<5E-10 |
10 years |
| <4E-05 |
<5E-10 |
20 years |
| CPU 315F-2 PN/DP |
6ES7315-2FH10-0AB0 |
4,76E-05 |
1,09E-09 |
10 years |
| 9,52E-05 |
1,09E-09 |
20 years |
| 6ES7315-2FH13-0AB0 |
4,76E-05 |
1,09E-09 |
10 years |
| 9,52E-05 |
1,09E-09 |
20 years |
| 6ES7315-2FJ14-0AB0 |
<4E-05 |
<1E-09 |
10 years |
| <8E-05 |
<1E-09 |
20 years |
| CPU 317F-2DP |
6ES7317-6FF00-0AB0 |
4,76E-05 |
1,09E-09 |
10 years |
| 9,52E-05 |
1,09E-09 |
20 years |
| 6ES7317-6FF03-0AB0 |
4,76E-05 |
1,09E-09 |
10 years |
| 9,52E-05 |
1,09E-09 |
20 years |
| 6ES7317-6FF04-0AB0 |
<4E-05 |
<1E-09 |
10 years |
| <8E-05 |
<1E-09 |
20 years |
| CPU 317F-2 PN/DP |
6ES7317-2FJ10-0AB0 |
4,76E-05 |
1,09E-09 |
10 years |
| 9,52E-05 |
1,09E-09 |
20 years |
| 6ES7317-2FK13-0AB0 |
4,76E-05 |
1,09E-09 |
10 years |
| 9,52E-05 |
1,09E-09 |
20 years |
| 6ES7317-2FK14-0AB0 |
<4E-05 |
<1E-09 |
10 years |
| <8E-05 |
<1E-09 |
20 years |
| CPU 317TF-2 DP |
6ES7317-6TF14-0AB0 |
<4E-05 |
<1E-09 |
10 years |
| <8E-05 |
<1E-09 |
20 years |
| CPU 319F-3 PN/DP |
6ES7318-3FL00-0AB0 |
<1E-04 |
<3E-09 |
10 years |
| <2E-04 |
<3E-09 |
20 years |
| 6ES7318-3FL01-0AB0 |
<1E-04 |
<3E-09 |
10 years |
| <2E-04 |
<3E-09 |
20 years |
| CPU 412-3H |
6ES7412-3HJ14-0AB0 |
1,9E-04 |
4,3E-09 |
10 years |
| 3,8E-04 |
4,3E-09 |
20 years |
| CPU 412-5H PN/DP |
6ES7412-5HK06-0AB0 |
<1,9E-04 |
<4,3E-09 |
10 years |
| <3,8E-04 |
<4,3E-09 |
20 years |
| CPU 414F-3 PN/DP |
6ES7414-3FM06-0AB0 |
<4,5E-05 |
<1E-09 |
10 years |
| <9E-05 |
<1E-09 |
20 years |
| CPU 414-4H |
6ES7414-4HJ00-0AB0 |
1,24E-04 |
1,42E-09 |
10 years |
| 2,48E-04 |
1,42E-09 |
20 years |
| 6ES7414-4HJ04-0AB0 |
1,88E-04 |
4,29E-09 |
10 years |
| 3,76E-04 |
4,29E-09 |
20 years |
| 6ES7414-4HM14-0AB0 |
1,9E-04 |
4,3E-09 |
10 years |
| 3,8E-04 |
4,3E-09 |
20 years |
| CPU 414-5H PN/DP |
6ES7414-5HM06-0AB0 |
<1,9E-04 |
<4,3E-09 |
10 years |
| <3,8E-04 |
<4,3E-09 |
20 years |
| CPU 416F-2 |
6ES7416-2FK02-0AB0 |
4,76E-05 |
1,09E-09 |
10 years |
| 9,52E-05 |
1,09E-09 |
20 years |
| 6ES7416-2FK04-0AB0 |
4,76E-05 |
1,09E-09 |
10 years |
| 9,52E-05 |
1,09E-09 |
20 years |
| 6ES7416-2FN05-0AB0 |
4,76E-05 |
1,09E-09 |
10 years |
| 9,52E-05 |
1,09E-09 |
20 years |
| CPU 416F-3 PN/DP |
6ES7416-3FR05-0AB0 |
4,76E-05 |
1,09E-09 |
10 years |
| 9,52E-05 |
1,09E-09 |
20 years |
| 6ES7416-3FS06-0AB0 |
<4,5E-05 |
<1E-09 |
10 years |
| <9E-05 |
<1E-09 |
20 years |
| CPU 416-5H PN/DP |
6ES7416-5HS06-0AB0 |
<1,9E-04 |
<4,3E-09 |
10 years |
| <3,8E-04 |
<4,3E-09 |
20 years |
| CPU 417-4H |
6ES7417-4HL01-0AB0 |
1,24E-04 |
1,42E-09 |
10 years |
| 2,48E-04 |
1,42E-09 |
20 years |
| 6ES7417-4HL04-0AB0 |
1,88E-04 |
4,29E-09 |
10 years |
| 3,76E-04 |
4,29E-09 |
20 years |
| 6ES7417-4HT14-0AB0 |
1,9E-04 |
4,3E-09 |
10 years |
| 3,8E-04 |
4,3E-09 |
20 years |
| CPU 417-5H PN/DP |
6ES7417-5HT06-0AB0 |
<1,9E-04 |
<4,3E-09 |
10 years |
| <3,8E-04 |
<4,3E-09 |
20 years |
| WinAC RTX F |
6ES7671-1RC07-0YA0 |
<1E-04 |
<3E-09 |
10 years |
| 6ES7671-1RC08-0YA0 |
<1E-04 |
<3E-09 |
10 years |
Table 01
The PFH and PFD values are given in the System Manual "Safety Engineering in SIMATIC S7" (Entry ID 12490443) or in the Product Information of the F CPUs concerned.
Note
Explanation of abbreviations used:
- SIL: Safety Integrity Level
- SIL CL: SIL claim
- PL: Performance Level
You can also stretch out the proof test interval (or mission time) to 20 years for the products of the ET 200M product group listed below.
| ET 200M |
MLFB |
PFD |
PFH |
Proof test interval |
SM326 F-DI 24
(SIL CL 2, PL d) |
6ES7326-1BK01-0AB0 |
< 1.00E-04 |
< 1.00E-08 |
20 years |
SM326 F-DI 24
(SIL CL 3, PL e) |
6ES7326-1BK01-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
SM326 F-DI 24
(SIL CL 2, PL d) |
6ES7326-1BK02-0AB0 |
< 1.00E-04 |
< 1.00E-08 |
20 years |
SM326 F-DI 24
(SIL CL 3, PL e) |
6ES7326-1BK02-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
SM326 F-DI 8 Namur
(SIL CL 2, PL d) |
6ES7326-1RF00-0AB0 |
< 1.00E-04 |
< 1.00E-08 |
20 years |
SM326 F-DI 8 Namur
(SIL CL 3, PL e) |
6ES7326-1RF00-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
| SM326 F-DO 10 |
6ES7326-2BF01-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
20 years |
| SM326 F-DO 10 |
6ES7326-2BF10-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
20 years |
| SM326 F-DO 8 |
6ES7326-2BF40-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
20 years |
| SM326 F-DO 8 |
6ES7326-2BF41-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
20 years |
| SM336 F-AI 6 |
6ES7336-1HE00-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
20 years |
SM336 F-AI 6x
0/4..20mA HART |
6ES7336-4GE00-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
20 years |
Table 02
You can also stretch out the proof test interval (or mission time) to 20 years for the products of the ET 200S product group listed below.
| ET 200S |
MLFB |
PFD |
PFH |
Proof test interval |
| EM138 PM-E F pm |
6ES7138-4CF02-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
20 years |
| EM138 PM-E F pm |
6ES7138-4CF03-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
20 years |
| EM138 PM-E F pp |
6ES7138-4CF41-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
20 years |
| EM138 PM-E F pp |
6ES7138-4CF42-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
20 years |
EM138 4/8 F-DI
(SIL CL 2, PL d) |
6ES7138-4FA00-0AB0 |
< 1.00E-03 |
< 1.00E-08 |
20 years |
EM138 4/8 F-DI
(SIL CL 3, PL e) |
6ES7138-4FA00-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
EM138 4/8 F-DI
(SIL CL 2, PL d) |
6ES7138-4FA01-0AB0 |
< 1.00E-03 |
< 1.00E-08 |
20 years |
EM138 4/8 F-DI
(SIL CL 3, PL e) |
6ES7138-4FA01-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
EM138 4/8 F-DI
(SIL CL 2, PL d) |
6ES7138-4FA02-0AB0 |
< 1.00E-03 |
< 1.00E-08 |
20 years |
EM138 4/8 F-DI
(SIL CL 3, PL e) |
6ES7138-4FA02-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
EM138 4/8 F-DI
(SIL CL 2, PL d) |
6ES7138-4FA03-0AB0 |
< 1.00E-03 |
< 1.00E-08 |
20 years |
EM138 4/8 F-DI
(SIL CL 3, PL e) |
6ES7138-4FA03-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
EM138 4/8 F-DI
(SIL CL 2, PL d) |
6ES7138-4FA04-0AB0 |
< 1.00E-03 |
< 1.00E-08 |
20 years |
EM138 4/8 F-DI
(SIL CL 3, PL e) |
6ES7138-4FA04-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
| EM138 4 F-DO |
6ES7138-4FB00-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
20 years |
| EM138 4 F-DO |
6ES7138-4FB01-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
20 years |
| EM138 4 F-DO |
6ES7138-4FB02-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
20 years |
| EM138 4 F-DO |
6ES7138-4FB03-0AB0 |
< 1.00E-05 |
< 1.00E-10 |
20 years |
EM138 4 F-DI/3 F-DO
(SIL CL 2, PL d) |
6ES7 138-4FC00-0AB0 |
< 1.00E-04 |
< 1.00E-08 |
20 years |
EM138 4 F-DI/3 F-DO
(SIL CL 2, PL d) |
6ES7138-4FC01-0AB0 |
< 1.00E-04 |
< 1.00E-08 |
20 years |
| EM138 1 F-RO |
6ES7 138-4FR00-0AA0 |
< 1.00E-05 |
< 1.00E-09 |
20 years |
Table 03
You can also stretch out the proof test interval (or mission time) to 20 years for the products of the ET 200iSP product group listed below.
| ET 200iSP |
MLFB |
PFD |
PFH |
Proof test interval |
EM138 8 F-DI Ex NAMUR
(SIL CL 3, PL e) for 1-channel and 2-channel connections |
6ES7138-7FN00-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
20 years |
EM138 4 F-DO Ex 17.4V/40mA
(SIL CL 3, PL e) |
6ES7138-7FD00-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
20 years |
EM138 4 F-AI Ex HART
(SIL CL 3, PL e) |
6ES7138-7FA00-0AB0 |
< 1.00E-04 |
< 1.00E-08 |
20 years |
EM138 4 F-AI Ex NAMUR
(SIL CL 3, PL e) 2-channel connections to 2 modules and evaluation in the F CPU |
6ES7138-7FA00-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
Table 04
You can also stretch out the proof test interval (or mission time) to 20 years for the products of the ET 200eco product group listed below.
| ET 200eco |
MLFB |
PFD |
PFH |
Proof test interval |
EM148 4/8 F-DI
(SIL CL 2, PL d) |
6ES7148-3FA00-0XB0 |
< 1.00E-03 |
< 1.00E-08 |
20 years |
EM148 4/8 F-DI
(SIL CL 3, PL e) |
6ES7148-3FA00-0XB0 |
< 1.00E-05 |
< 1.00E-10 |
20 years |
Table 05
You can also stretch out the proof test interval (or mission time) to 20 years for the products of the ET 200PRO product group listed below.
| ET 200PRO |
MLFB |
PFD |
PFH |
Proof test interval |
EM148 8/16 F-DI
(SIL CL 2, PL d) |
6ES7148-4FA00-0AB0 |
< 1.00E-03 |
< 1.00E-08 |
20 years |
EM148 8/16 F-DI
(SIL CL 3, PL e) |
6ES7148-4FA00-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
EM148 4/8 F-DI/ 4 F-DO
(SIL CL 2, PL d) |
6ES7148-4FC00-0AB0 |
< 1.00E-03 |
< 1.00E-08 |
20 years |
EM148 4/8 F-DI/ 4 F-DO
(SIL CL 3, PL e) |
6ES7148-4FC00-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
| EM148 F-Switch |
6ES7148-4FS00-0AB0 |
< 1.00E-05 |
< 1.00E-09 |
20 years |
Table 06
By way of information, below is a list of the probability of failure (PTE) for the safe communication paths where PTE stands for "Probability of Transmission Error").
| Communication |
PFD |
PFH |
Remarks |
PLC<-->PLC Communication
(F-SEND<-->F-RECEIVE) |
< 1.00E-05 |
< 1.00E-09 |
This value is added once per
PLC <--> PLC communication in the evaluation of the safety function. |
PROFIsafe
F-IN-->F-CPU-->F-OUT |
< 1.00E-05 |
< 1.00E-09 |
This value is added only once in the evaluation of the safety function. |
Table 07
Additional Keywords
Fail-safe, IEC 62061, ISO 13849, IEC 61511, VDI2180, S7 Distributed Safety, F Systems, Process Safety, Proof Test Interval
|
german
